Exhibitors

TOYOTech

Current density-Voltage-Luminance (JVL) measurements are widely used to evaluate organic light-emitting diodes (OLEDs). These measurement results are mainly discussed about current density and luminance in high-voltage regions. However, it has been required to evaluate JVL characteristics in a low driving voltage region to investigate behaviors such as charge injections and emissions in OLEDs.
DCM1000 is developed with Sharp Display Technology Corporation and Japan Advanced Institute of Science Technology (JAIST) for evaluations of OLEDs to obtain Displacement current-JVL (DC-JVL) data with high measurement sensitivity. The results provide a novel analysis approach of degradation for the OLED industry.